TE270 is a SAP table coming under IS module and IS-UT component.View details, Fields & related tables of TE270 in SAP.
- Table description : System Parameters for Sampling Proc./Cert. in IS-U DevMan.
- Module : IS-U-DM
- Parent Module : IS
- Package : EE10
- Software Component : IS-UT
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Definitions
What is SAP ?SAP is the short form of Systems, Applications & Products in Data Processing. It is one of the largest business process related software. This software focused on business processes on ERP & CRM.
What is table in SAP ?Like most other software, SAP also using database tables to store the data. In SAP thousands of tables are there to store different data. A table contains several fields and some of the fields will be key fields.
SAP TE270 Table Fields structure
| Field | Note | Data Element | Domain |
|---|---|---|---|
| MANDT | Client | MANDT | MANDT |
| VERLOS | Indicator: Loss of lot membership if removed/replaced | VERLOS | AKTKN |
| VERBGL | Loss of certifiction if removed/replaced | VERBGL | AKTKN |
| BGLLOS | Device certification failure leads to loss of lot membership | BGLLOS | KENNZX |
| INTPRF | Internal cert. period is longer than calibration validity | INTPRF | KENNZX |
| LOSLAGER | Uninstalled Devices Can Be Allocated to Lot | LOSLAGER | KENNZX |
| CHLOS | Manipulation of devices despite lot inspection/drawing | CHLOS | KENNZX |
| LAGINC | Warehouse devices allowed as sample devices | LAGINC | KENNZX |
| NLEG97 | Certification/seal extension control | NLEG97 | KENNZX |
| NLBGLJ | Certification year same as installation year | NLBGLJ | KENNZX |
| CHSTI | Repeated use of devices for inspection | CHSTI | KENNZX |
| CHBGL | Retain lot membership during certification | CHBGL | KENNZX |
| CERTDEV | Certification period of device overrides lot | CERTDEV | KENNZX |
| CERTLOTDEV | Only certified devices can be allocated to lots | CERTLOTDEV | AKTKN |
| NO_SAMPLE_DEV | Exclude devices from sample drawing in I/R/R | NO_SAMPLE_DEV | KENNZX |
| SEALDATECHECK | Check Last Seal Date Against Current Date | SEALDATECHECK | KENNZX |
| LOT_BREAKUP_PERI | No. of Years Within Which Lot Devices Must Be Replaced | LOT_BREAKUP_PERIOD |
TE270 related tables
| Table | Note |
|---|---|
| TE270 | System Parameters for Sampling Proc./Cert. in IS-U DevMan. |
| FMFGT_SS04 | Payment Statistical Sampling Proc. Batch/certify Dates |
| TC50 | PP-PI: Proc.Message Categories/ Proc.Instruction Categories |
| TCB10 | Predefined Proc. Message Categories/Proc. Instr. Categories |
| TEDEF | Assign proc. type to funct. module that processes proc. type |
| TRGT_MIGR_AMP | Migration: Assign Opertive Posit. Proc. to Par. Amort Proc. |
| J_1ANUGR3T | Texts for numbering groups for withh. cert. numbering |
| N2N3AF12 | PDOK: N3AFRM12 HI: Med. Cert. for Sick Pay in the Event of |
| TIVBH | Accomm.entitlement cert.: Special groups of people - Texts |
| VTPRG | Transport. planng system cumulation proc. for delivery item |
| CCIHC_MJCAT | EHS: Sampling Type |
| CCIHC_MJCATTXT | EHS: Language-Dependent Description for Sampling Type |
| CCIHC_MPTYPCAT | EHS: Assignment Measurement Project Type to Sampling Type |
| CCIHC_MSOURCE | EHS: Sampling Locations |
| CCIHC_MSOURCETXT | EHS: Language-Dependent Description for Sampling Locations |
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